Cull, B., Shi, Y., & Kumar, S. (1995). X-Ray Reflectivity Study of Interface Roughness, Structure, and Morphology of Alignment Layers and Thin Liquid-Crystal Films. Physical Review E. https://doi.org/10.1103/PhysRevE.51.526
Cull, Brian, Yushan Shi, and Satyendra Kumar. 1995. “X-Ray Reflectivity Study of Interface Roughness, Structure, and Morphology of Alignment Layers and Thin Liquid-Crystal Films”. Physical Review E. https://doi.org/10.1103/PhysRevE.51.526.
Cull, B., Y. Shi, and S. Kumar. X-Ray Reflectivity Study of Interface Roughness, Structure, and Morphology of Alignment Layers and Thin Liquid-Crystal Films. Physical Review E, 15 Jan. 1995, doi:10.1103/PhysRevE.51.526.