The popular “high-electric-field” technique to determine the polar anchoring coefficient W of a nematic–substrate interface requires the simultaneous measurement of the capacitance and optical phase retardation of a liquid crystal cell as a function of applied voltage. We develop a generalized model that makes it possible to eliminate the capacitance measurement. The new technique, called the RV (retardation versus voltage) technique, requires only themeasurement of retardation as a function of applied voltage, and allows for the determination ofW by a linear fit over a prescribed voltage window. The technique is not sensitive to uniformity of the cell thickness, does not require patterned electrodes, and allows for the local probe of thesurface. The value of W obtained by the RV technique is the same as W obtained by the traditional technique.
Applied Physics Letters
Copyright 1999 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 75, 202 (1999) and may be found at http://dx.doi.org/10.1063/1.124319.
Natishin, Yu A.; Polak, R. D.; Shiyanovskii, Sergij V.; Lavrentovich, Oleg (1999). Determination of Nematic Polar Anchoring from Retardation Versus Voltage Measurements. Applied Physics Letters 75(2) 202-204. doi: 10.1063/1.124319. Retrieved from https://oaks.kent.edu/cpippubs/78